The group of X-ray structural analysis solves the problems of qualitative and quantitative phase analysis of metallic materials, precision determination of the crystal lattice parameters, determination of the parameters of the fine structure of polycrystals (the average size of coherent scattering regions and rms relative microstrain), measurement of the texture of materials by the method of constructing inverse and direct pole figures. The laboratory is equipped with a general-purpose X-ray diffractometer: DRON-4 with an automated attachment for recording straight pole figures, DRON-4-07 with hardware and software complexes for controlling the diffractometer and recording measurement results.